Investigating the root causes of PID of different perovskite solar cells concerning encapsulants
Potential-induced degradation (PID) can severely limit the lifetime of solar cells. In the case of silicon cells, it was possible to understand the causes of PID and to avoid it by technological changes. However, it is very likely that perovskite solar cells (PSCs) will also be affected by the phenomenon. Even though the stability of PSCs under elevated temperature and irradiation has been investigated by several studies, there is only limited data on PID. To the author's best knowledge, only three papers have been published, and they all indicated the degradation of PSCs under high voltage stress [1]- [3]. With the limited knowledge and the lack of PID test standardization, efficient measures against PID in PSCs remain unknown. In this study, the possibilities of accelerated PID tests of PSCs and the PID sensitivity of different PSCs with varying encapsulants will be investigated through a postmortem root cause analysis.
Status: Ongoing
Date of proposal: 08/11/2022
Start date:
End Date:
Used Instruments:
Experimental Technique:
Experiment Description:
Type Samples:
Sample Description:
Experiment Data Type:
Characterization Technics:
Characterization Data Type:
Analyzed Data:
Main Targets Project:
Main Achievements Findings: